Atomic-scale properties of low-index ZnO surfaces

U. Diebold, L. V. Koplitz, O. Dulub

Department of Physics, Tulane University, New Orleans, Louisiana 70118, U.S.A.
Department of Chemistry, Loyola University, New Orleans, LA 70118, U.S.A.

Appl. Surf. Sci. 237 (2004) 336-342

Zinc oxide (ZnO) is an important material in heterogeneous catalysis and has recently attracted interest as a wide band-gap semiconductor for electro-optical devices. The surfaces and interfaces of ZnO are critical for understanding the mechanistics of surface chemical reactions and for the fabrication of high quality hetero- and homoepitaxial films with long-term stability. The surfaces of the main low-index planes, i.e., surfaces with (0001), (000-1), (10-10), (11-20) and (11-21) orientations are characterized with high-resolution scanning tunneling microscopy and compared to first-principles total-energy calculations.

Corresponding author: U. Diebold (diebold at iap_tuwien_ac_at).

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