1 Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner
J. Phys. Chem. C 2016, 120, 22730−22738

2 Correction to “Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2016, 120, 2484 84

3 Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate
Wolfgang S.M. Werner , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui
Surface Science 635 (2015) L1–L3

4 Physics-based Simulation Models for EBSD: Advances and Challenges
Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner
arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015

5 Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2015, 119, 17687

6 Interpretation of nanoparticle X-ray photoelectron intensities
Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell
Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065

7 In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al
Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek
PHYSICAL REVIEW B 89, 205435 (2014)

8 Interlaboratory study comparing anylses of simulated angle resolved XP Spectra
Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal and Cedric J. Powell
Surf. Interf. Anal 46, (2014) 321

9 Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing
D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner
Surf. Interface Anal. (2014)

10 SiON metrology using angular and energy distributions of photoelectrons
G Tasneem, C Tomastik, R Mroczynski and W S M Werner
Journal of Physics: Conference Series 439 (2013) 012005

11 Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials
Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal
050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628

12 Sample-morphology effects on x-ray photoelectron peak intensities
Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal
021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214

13 Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface
Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani
PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407

14 Electron Supersurface Scattering On Polycrystalline Au
Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek
PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110

15 Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm
F. Salvat-Pujol and W. S. M. Werner
Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175

16 Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)
Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell
Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007

17 In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface
J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner
Surf. Interface Anal. (2013) DOI 10.1002/sia.5331

18 Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric
O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli
Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094

19 Angular dependence of electron induced surface plasmon excitation
Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner
APL 98(2011)193111

20 Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy
F. Salvat-Pujol* and W. S. M. Werner
PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416

21 Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations
G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. (2010)

22 Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data
G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. 42(2010)1072

23 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
W.S.M. Werner, J. Zemek and P. Jiricek
Phys. Rev. B82(2010)155422

24 Electron transport for spectrum analysis and experiment design
W.S.M. Werner
J. Elec. Spec. Rel. Phen. 178-179(2010)154-177

25 Reflection electron energy loss spectroscopy of aluminum
P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner
Surface Science 604 (2010) 1006-1009

26 Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)
W.S.M. Werner
Surface Science 604 (2010) 290-299

27 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek
PHYSICAL REVIEW B 82, 155422 2010 DOI: 10.1103/PhysRevB.82.155422

28 Electron transport for spectrum analysis and experiment design
Wolfgang S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004

29 Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)
Wolfgang S.M. Werner
Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019

30 Optical constants and inelastic electron-scattering data for 17 elemental metals
Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092

31 Richardson - Lucy deconvolution of reflection electron energy loss spectra
Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner
Surf. Interf. Anal. (2009)

32 Report on the 47th IUVSTA Workshop “Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films”
A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\”over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme
Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105

33 Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals
Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009 doi:10.1063/1.3243762

34 Role of surface and bulk plasmon decay in secondary electron emission
Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani
Phys. Rev. B 78 (2008)233403

35 Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra
M.R. Went M. Vos a, W.S.M. Werner
Surf. Sci. 602(2008)2069-2077

36 Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths
Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl
Phys. Rev. B 77, R161404 (2008)

37 Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni
W.S.M. Werner
Surface Science 601 (2007) 2125-2138

38 Photon and electron induced electron emission from solid surfaces
W.S.M. Werner
Cahpter 2 In “Slow Heavy Particle Induced Electron Emission from Solid Surfaces”, Springer Tracts in Modern Physics 225

39 Energy dependence of electron energy loss processesin Ge 2s photoemission
M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner
Surf. Sci. 601(2007)2344

40 Comparison of hard and soft x-ray photoelectron spectra of silicon
F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione
Phys. Rev. B76(2007)085422

41 Surface plasmon excitation at a Au surface by 15040,000 eV electrons
Wolfgang S.M. Werner, Michael R. Went, Maarten Vos
Surf. Sci. 601(2007)L109

42 Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, and W. Smekal
Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula

43 Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria
Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\”udenauer and John F. Watts
Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421

44 Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 252116 (2006)

45 Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.
W.S.M. Werner
APPLIED PHYSICS LETTERS 89, 213106 (2006)

46 Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 172101 (2006)

47 Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).
W.S.M. Werner
Surf. Sci. 600(2006)L250-254

48 Differential surface and volume excitation probability of medium-energy electrons in solids.
W.S.M. Werner
Phys. Rev. B 74(2006) 075421

49 Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations
J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski
Surf. Interf. Anal.38(2006)615

50 Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O
W. S. M. Werner, J. Zemek and P. Jiricek
Surf. Interf. Anal. 38(2006)628

51 Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge
L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner
Surf. Interf. Anal. 38(2006)569

52 EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY
W.S.M. Werner, W. Smekal, H. St\”ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini
Elletra research highlights 2004-2005

53 Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR
Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\”ori H
Life Cycle Tribology 48(2005) 269-282

54 Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy
C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal
Applied Surface Science 239 (2005) 470-480

55 On the energy dissipation process in incoherent electron scattering
Wolfgang S.M. Werner, Peter Schattschneider
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80

56 Oxidation of beryllium: a scanningAuger investigation
C. Tomastik,W. Werner and H. St\”ori
Nucl. Fusion 45 (2005) 1061-1065

57 Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy
Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini
Phys. Rev. Lett. 94 (2005) 038302

58 A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon
C.J. Powell, W. Smekal and W.S.M. Werner
Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005

59 Angular-resolved photoelectron spectroscopyof corrugated surfaces
K. Olejnik, J. Zemek and W.S.M. Werner
Surface Science 595 (2005) 212-222

60 Coherence in electron energy loss spectrometry
P. Schattschneider and W.S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95

61 Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy
Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell
Surf. Interface Anal. 2005; 37: 1059-1067

62 Trajectory reversal approach for electron backscattering from solid surfaces
W.S.M. Werner
PHYSICAL REVIEW B 71, 115415 (2005)

63 Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)
W.S.M. Werner
Surf. Interface Anal. 2005; 37: 846-860

64 Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces
Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga
Surface Science 585 (2005) 85-94

65 Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt
W.S.M. Werner
Surface Science 588 (2005) 26-40

66 Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy
G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\”ori D.L. Beke
Thin Solid Films 459 (2004) 303-307

67 Quantitative surface analysis with electrons
W.S.M. Werner
Applied Surface Science 235 (2004) 2-14

68 Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models
W. Smekal, W.S.M. Werner, C.S. Fadley and M.A. van Hove
Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187

69 Electron Transport in Solids Chapter 10 in the book “Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy”
W.S.M. Werner
edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259

70 Charakterisierung monomolekuarer Schmierstofffilme
R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\”ori
in “Zuverl‰ssige Tribosysteme”, Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4

71 Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.
W.S.M. Werner, C Eisenmenger–Sittner, J. Zemek and P. Jiricek
Phys. Rev. B. 67(2003)

72 Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)
W.S.M. Werner
Surf. Interf. Anal. 35(2003)347

73 Surface and bulk plasmon coupling observed in refelection electron energy loss spectra
W.S.M. Werner
Surf. Sci. 526(2003)L159-L164

74 Wannier-Stark States in Finite Superlattices
M. Kast, C. Pacher, G. Strasser, E. Gornikand W.S.M. Werner
Phys. Rev. Lett. 89(2002)136803

75 Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni
L. Kñver, S. Tougaard, W.S.M. Werner, and I. Cserny
Surf. Interf. Anal. 33(2002)681

76 Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)
W.S.M. Werner, H. St\”ori and HP. Winter
Surf. Sci. 518(2002)L569

77 Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of Thin Cu and Ni Films
W.S.M. Werner, L. Kñver, J. Toth and D. Varga
J. Electron, Spectrosc. Rel. Phen. 122(2002)103

78 Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces
Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner
J. Vac. Sci. Technol. A 19, Sep-Oct 2001

79 Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons Backscattered from Al and Si Surfaces.
W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\”ori
J. Vac. Sci. Technol. A19(2001)2388

80 The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.
W.S.M.Werner, H. Tratnik, J. Brenner and H. St\”ori
Surf. Sci. 495(2001)107

81 Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces
W.S.M. Werner, W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 114(2001)363

82 Surface Excitation Probability of Medium .Energy Electrons in Metals and Semiconductors.
W.S.M.Werner, W. Smekal, C. Tomastik and H. St\”ori
Surf. Sci. 486(2001)L461

83 Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review
W.S.M.Werner
Surf. Interf. Analysis 31(2001)141

84 Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons Backscattered from a Polycrystalline Au Surface
W.S.M.Werner, W. Smekal and H. St\”ori
Surf. Interf. Analysis 31(2001)475

85 Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental Solids for Energies between 50 and 3400~eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 113(2001)127

86 Electron Probe Microanalysis Inverse Modelling
H.W. Wagner, W.S.M.Werner, H. St\”ori and L. Richardson
Nucl. Instr. Methods. Phys. Res. B184(2001)450

87 On Line Shape Analysis in X-ray Photoelectron spectroscopy
W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek
Surf. Sci. 470(2001)325

88 Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
Surf. Sci. 470(2000)L123

89 Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples
K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver
Surf. Interf. Analysis 29(2000)126

90 Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)386

91 Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)380

92 Escape Probability of Electrons in Total Electron Yield Experiments .
H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel
Adv. X-ray Anal. 41(1999)367

93 Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.
S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton and B. Fricke
Surf. Sci. 417(1998)372

94 Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach
H. W. Wagner and W. S. M. Werner
X-RAY SPECTROMETRY,27(1998)373

95 Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.
P.M.J.Schm\”olz, W.S.M.Werner, H. Wagner, H.St\”ori and J. Kiefer.
Surf. Interf. Anal, 26(1998)590

96 Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.
W.S.M.Werner
Surf. Interf. Anal, 26(1998)455

97 A New Method for the Calculation of Ionization Depth Distribution in EPMA
H. Wagner and W.S.M.Werner
X-Ray Spectrometry, 27(1998)373

98 Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.
W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte, V. Ambrose and J. Baker
J. Vac. Sci. and Technol., B16(1998)420

99 Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.
W.S.M.Werner.
J.Vac. Sci. Technol, A15(1997)465

100 Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.
W.S.M.Werner
Jap. J. of Surface Anal., 3(1997)312

101 Slowing Down of Medium Energy Electrons in Solids.
W.S.M.Werner
Phys. Rev., B55(1997)14925

102 Escape Probability of Electrons in Total Electron Yield Experiments
H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel
Adv. x-Ray Analysis, in print

103 Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
I.S. Tilinin, A. Jablonski and W.S.M. Werner
Progress in Surface Science 52(1996)193-335

104 A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.
H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner, H.St\”ori and M. Gr\”oschl
Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.

105 Quantitative Surface Analysis by Means of AES.
I.S.Tilinin, A.Jablonski and W.S.M.Werner.
Prog. Surf. Sci., 52(1996)193

106 Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.
H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.
Mikrochim. Act., 13(1996)533

107 Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.
H.Wagner, C.Schiebl and W.S.M.Werner.
Mikrochim. Act.,13(1996)623

108 Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.
W.S.M.Werner.
Mikrochim. Act., 13(1996)13

109 Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.
C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\”olz, W.S.M.Werner and H.St\”ori.
Vacuum 46(1995)1281

110 Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.
W.S.M.Werner
Surf. Interf. Anal., 23(1995)737

111 Efficient Calculation of Photoelectron Angular Distribution.
W.S.M.Werner, I.S.Tilinin and A.Jablonski.
Surf. Interf. Anal., 23(1995)823

112 Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.
W.S.M.Werner.
Surf. Interf. Anal., 23(1995)696.

113 Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape
W.S.M.Werner.
Phys. Rev. B52(1995)2964.

114 Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.
H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.
Surf. Interf. Anal. 22(1994)120

115 Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and Au.
W.S.M.Werner and M.Hayek.
Surf. Interf. Anal. 22(1994)79

116 Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..
W.S.M.Werner, and I.S.Tilinin.
J. Vac. Sci. Technol. A12(1994)2337.

117 Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.
W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.
Surf. Interf. Anal. 21(1994)21

118 Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.
W.S.M.Werner, M.Hayek and I.S.Tilinin.
Phys. Rev. B50(1994)4819.

119 Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Prog. Surf. Sci. 46(1994)46.

120 New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis
I.S.Tilinin and W.S.M.Werner.
Mikrochim. Act. 114/115(1994)485.

121 Reply to Comment on “Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets” by V.M. Dwyer
W.S.M.Werner and I.S.Tilinin .
Surf. Sci. 304(1994)385.

122 The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\”ori and J.Barounig.
Thin Solid Films 228(1993)56

123 Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets
I.S.Tilinin and W.S.M.Werner.
Surf. Sci. 290(1993)119.

124 Escape Probability of Auger and Photoelectrons from Solids.
W.S.M.Werner and I.S.Tilinin.
Appl. Surf. Sci. 70/71(1993)29.

125 Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\”ori and J.Barounig.
Surface and Coatings Technology 54/55(1992)329

126 Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent XPS.
W.S.M.Werner, G.C.Smith and A.K.Livesey.
Surf. Interf. Anal. 21(1992)38.

127 The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.
I.S.Tilinin and W.S.M.Werner.
Phys. Rev. B46(1992)13739

128 The Role of the Attenuation Parameter in Electron Spectroscopy
W.S.M.Werner.
J. Electr.Spectrosc. Relat. Phen. 59(1992)275.

129 Attenuation of Electrons in Non-crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Surf. Sci. Lett. 268(1992)L319.

130 A new Formalism for Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.
W.S.M.Werner and H.St\”ori.
Surf. Interf. Anal. 19(1992)83

131 Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.
W.S.M.Werner.
Surf. Interf. Anal. 18(1992)217.

132 Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.
W.S.M.Werner, W.H.Gries and H.St\”ori.
Surf. Interf. Anal.17(1991)693

133 On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.
W.S.M.Werner.
Surf. Sci. 257(1991)319

134 Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.
W.S.M.Werner.
Surf. Sci. 251/252(1991)336

135 A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies
W.S.M.Werner, W.H.Gries and H. St\”ori
J. Vac. Sci. Technol. A9(1991)21

136 Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.
W.H.Gries and W.S.M.Werner
Surf. Interf. Anal. 16(1990)149

1 Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner
J. Phys. Chem. C 2016, 120, 22730−22738

2 Correction to “Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2016, 120, 2484 84

3 Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate
Wolfgang S.M. Werner , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui
Surface Science 635 (2015) L1–L3

4 Physics-based Simulation Models for EBSD: Advances and Challenges
Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner
arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015

5 Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2015, 119, 17687

6 Interpretation of nanoparticle X-ray photoelectron intensities
Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell
Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065

7 In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al
Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek
PHYSICAL REVIEW B 89, 205435 (2014)

8 Interlaboratory study comparing anylses of simulated angle resolved XP Spectra
Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal and Cedric J. Powell
Surf. Interf. Anal 46, (2014) 321

9 Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing
D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner
Surf. Interface Anal. (2014)

10 SiON metrology using angular and energy distributions of photoelectrons
G Tasneem, C Tomastik, R Mroczynski and W S M Werner
Journal of Physics: Conference Series 439 (2013) 012005

11 Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials
Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal
050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628

12 Sample-morphology effects on x-ray photoelectron peak intensities
Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal
021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214

13 Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface
Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani
PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407

14 Electron Supersurface Scattering On Polycrystalline Au
Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek
PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110

15 Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm
F. Salvat-Pujol and W. S. M. Werner
Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175

16 Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)
Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell
Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007

17 In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface
J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner
Surf. Interface Anal. (2013) DOI 10.1002/sia.5331

18 Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric
O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli
Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094

19 Angular dependence of electron induced surface plasmon excitation
Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner
APL 98(2011)193111

20 Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy
F. Salvat-Pujol* and W. S. M. Werner
PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416

21 Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations
G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. (2010)

22 Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data
G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. 42(2010)1072

23 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
W.S.M. Werner, J. Zemek and P. Jiricek
Phys. Rev. B82(2010)155422

24 Electron transport for spectrum analysis and experiment design
W.S.M. Werner
J. Elec. Spec. Rel. Phen. 178-179(2010)154-177

25 Reflection electron energy loss spectroscopy of aluminum
P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner
Surface Science 604 (2010) 1006-1009

26 Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)
W.S.M. Werner
Surface Science 604 (2010) 290-299

27 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek
PHYSICAL REVIEW B 82, 155422 2010 DOI: 10.1103/PhysRevB.82.155422

28 Electron transport for spectrum analysis and experiment design
Wolfgang S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004

29 Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)
Wolfgang S.M. Werner
Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019

30 Optical constants and inelastic electron-scattering data for 17 elemental metals
Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092

31 Richardson - Lucy deconvolution of reflection electron energy loss spectra
Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner
Surf. Interf. Anal. (2009)

32 Report on the 47th IUVSTA Workshop “Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films”
A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\”over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme
Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105

33 Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals
Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009 doi:10.1063/1.3243762

34 Role of surface and bulk plasmon decay in secondary electron emission
Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani
Phys. Rev. B 78 (2008)233403

35 Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra
M.R. Went M. Vos a, W.S.M. Werner
Surf. Sci. 602(2008)2069-2077

36 Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths
Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl
Phys. Rev. B 77, R161404 (2008)

37 Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni
W.S.M. Werner
Surface Science 601 (2007) 2125-2138

38 Photon and electron induced electron emission from solid surfaces
W.S.M. Werner
Cahpter 2 In “Slow Heavy Particle Induced Electron Emission from Solid Surfaces”, Springer Tracts in Modern Physics 225

39 Energy dependence of electron energy loss processesin Ge 2s photoemission
M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner
Surf. Sci. 601(2007)2344

40 Comparison of hard and soft x-ray photoelectron spectra of silicon
F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione
Phys. Rev. B76(2007)085422

41 Surface plasmon excitation at a Au surface by 15040,000 eV electrons
Wolfgang S.M. Werner, Michael R. Went, Maarten Vos
Surf. Sci. 601(2007)L109

42 Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, and W. Smekal
Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula

43 Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria
Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\”udenauer and John F. Watts
Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421

44 Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 252116 (2006)

45 Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.
W.S.M. Werner
APPLIED PHYSICS LETTERS 89, 213106 (2006)

46 Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 172101 (2006)

47 Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).
W.S.M. Werner
Surf. Sci. 600(2006)L250-254

48 Differential surface and volume excitation probability of medium-energy electrons in solids.
W.S.M. Werner
Phys. Rev. B 74(2006) 075421

49 Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations
J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski
Surf. Interf. Anal.38(2006)615

50 Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O
W. S. M. Werner, J. Zemek and P. Jiricek
Surf. Interf. Anal. 38(2006)628

51 Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge
L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner
Surf. Interf. Anal. 38(2006)569

52 EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY
W.S.M. Werner, W. Smekal, H. St\”ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini
Elletra research highlights 2004-2005

53 Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR
Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\”ori H
Life Cycle Tribology 48(2005) 269-282

54 Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy
C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal
Applied Surface Science 239 (2005) 470-480

55 On the energy dissipation process in incoherent electron scattering
Wolfgang S.M. Werner, Peter Schattschneider
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80

56 Oxidation of beryllium: a scanningAuger investigation
C. Tomastik,W. Werner and H. St\”ori
Nucl. Fusion 45 (2005) 1061-1065

57 Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy
Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini
Phys. Rev. Lett. 94 (2005) 038302

58 A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon
C.J. Powell, W. Smekal and W.S.M. Werner
Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005

59 Angular-resolved photoelectron spectroscopyof corrugated surfaces
K. Olejnik, J. Zemek and W.S.M. Werner
Surface Science 595 (2005) 212-222

60 Coherence in electron energy loss spectrometry
P. Schattschneider and W.S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95

61 Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy
Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell
Surf. Interface Anal. 2005; 37: 1059-1067

62 Trajectory reversal approach for electron backscattering from solid surfaces
W.S.M. Werner
PHYSICAL REVIEW B 71, 115415 (2005)

63 Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)
W.S.M. Werner
Surf. Interface Anal. 2005; 37: 846-860

64 Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces
Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga
Surface Science 585 (2005) 85-94

65 Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt
W.S.M. Werner
Surface Science 588 (2005) 26-40

66 Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy
G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\”ori D.L. Beke
Thin Solid Films 459 (2004) 303-307

67 Quantitative surface analysis with electrons
W.S.M. Werner
Applied Surface Science 235 (2004) 2-14

68 Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models
W. Smekal, W.S.M. Werner, C.S. Fadley and M.A. van Hove
Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187

69 Electron Transport in Solids Chapter 10 in the book “Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy”
W.S.M. Werner
edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259

70 Charakterisierung monomolekuarer Schmierstofffilme
R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\”ori
in “Zuverl‰ssige Tribosysteme”, Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4

71 Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.
W.S.M. Werner, C Eisenmenger–Sittner, J. Zemek and P. Jiricek
Phys. Rev. B. 67(2003)

72 Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)
W.S.M. Werner
Surf. Interf. Anal. 35(2003)347

73 Surface and bulk plasmon coupling observed in refelection electron energy loss spectra
W.S.M. Werner
Surf. Sci. 526(2003)L159-L164

74 Wannier-Stark States in Finite Superlattices
M. Kast, C. Pacher, G. Strasser, E. Gornikand W.S.M. Werner
Phys. Rev. Lett. 89(2002)136803

75 Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni
L. Kñver, S. Tougaard, W.S.M. Werner, and I. Cserny
Surf. Interf. Anal. 33(2002)681

76 Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)
W.S.M. Werner, H. St\”ori and HP. Winter
Surf. Sci. 518(2002)L569

77 Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of Thin Cu and Ni Films
W.S.M. Werner, L. Kñver, J. Toth and D. Varga
J. Electron, Spectrosc. Rel. Phen. 122(2002)103

78 Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces
Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner
J. Vac. Sci. Technol. A 19, Sep-Oct 2001

79 Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons Backscattered from Al and Si Surfaces.
W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\”ori
J. Vac. Sci. Technol. A19(2001)2388

80 The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.
W.S.M.Werner, H. Tratnik, J. Brenner and H. St\”ori
Surf. Sci. 495(2001)107

81 Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces
W.S.M. Werner, W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 114(2001)363

82 Surface Excitation Probability of Medium .Energy Electrons in Metals and Semiconductors.
W.S.M.Werner, W. Smekal, C. Tomastik and H. St\”ori
Surf. Sci. 486(2001)L461

83 Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review
W.S.M.Werner
Surf. Interf. Analysis 31(2001)141

84 Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons Backscattered from a Polycrystalline Au Surface
W.S.M.Werner, W. Smekal and H. St\”ori
Surf. Interf. Analysis 31(2001)475

85 Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental Solids for Energies between 50 and 3400~eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 113(2001)127

86 Electron Probe Microanalysis Inverse Modelling
H.W. Wagner, W.S.M.Werner, H. St\”ori and L. Richardson
Nucl. Instr. Methods. Phys. Res. B184(2001)450

87 On Line Shape Analysis in X-ray Photoelectron spectroscopy
W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek
Surf. Sci. 470(2001)325

88 Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
Surf. Sci. 470(2000)L123

89 Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples
K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver
Surf. Interf. Analysis 29(2000)126

90 Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)386

91 Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)380

92 Escape Probability of Electrons in Total Electron Yield Experiments .
H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel
Adv. X-ray Anal. 41(1999)367

93 Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.
S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton and B. Fricke
Surf. Sci. 417(1998)372

94 Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach
H. W. Wagner and W. S. M. Werner
X-RAY SPECTROMETRY,27(1998)373

95 Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.
P.M.J.Schm\”olz, W.S.M.Werner, H. Wagner, H.St\”ori and J. Kiefer.
Surf. Interf. Anal, 26(1998)590

96 Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.
W.S.M.Werner
Surf. Interf. Anal, 26(1998)455

97 A New Method for the Calculation of Ionization Depth Distribution in EPMA
H. Wagner and W.S.M.Werner
X-Ray Spectrometry, 27(1998)373

98 Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.
W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte, V. Ambrose and J. Baker
J. Vac. Sci. and Technol., B16(1998)420

99 Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.
W.S.M.Werner.
J.Vac. Sci. Technol, A15(1997)465

100 Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.
W.S.M.Werner
Jap. J. of Surface Anal., 3(1997)312

101 Slowing Down of Medium Energy Electrons in Solids.
W.S.M.Werner
Phys. Rev., B55(1997)14925

102 Escape Probability of Electrons in Total Electron Yield Experiments
H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel
Adv. x-Ray Analysis, in print

103 Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
I.S. Tilinin, A. Jablonski and W.S.M. Werner
Progress in Surface Science 52(1996)193-335

104 A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.
H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner, H.St\”ori and M. Gr\”oschl
Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.

105 Quantitative Surface Analysis by Means of AES.
I.S.Tilinin, A.Jablonski and W.S.M.Werner.
Prog. Surf. Sci., 52(1996)193

106 Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.
H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.
Mikrochim. Act., 13(1996)533

107 Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.
H.Wagner, C.Schiebl and W.S.M.Werner.
Mikrochim. Act.,13(1996)623

108 Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.
W.S.M.Werner.
Mikrochim. Act., 13(1996)13

109 Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.
C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\”olz, W.S.M.Werner and H.St\”ori.
Vacuum 46(1995)1281

110 Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.
W.S.M.Werner
Surf. Interf. Anal., 23(1995)737

111 Efficient Calculation of Photoelectron Angular Distribution.
W.S.M.Werner, I.S.Tilinin and A.Jablonski.
Surf. Interf. Anal., 23(1995)823

112 Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.
W.S.M.Werner.
Surf. Interf. Anal., 23(1995)696.

113 Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape
W.S.M.Werner.
Phys. Rev. B52(1995)2964.

114 Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.
H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.
Surf. Interf. Anal. 22(1994)120

115 Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and Au.
W.S.M.Werner and M.Hayek.
Surf. Interf. Anal. 22(1994)79

116 Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..
W.S.M.Werner, and I.S.Tilinin.
J. Vac. Sci. Technol. A12(1994)2337.

117 Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.
W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.
Surf. Interf. Anal. 21(1994)21

118 Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.
W.S.M.Werner, M.Hayek and I.S.Tilinin.
Phys. Rev. B50(1994)4819.

119 Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Prog. Surf. Sci. 46(1994)46.

120 New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis
I.S.Tilinin and W.S.M.Werner.
Mikrochim. Act. 114/115(1994)485.

121 Reply to Comment on “Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets” by V.M. Dwyer
W.S.M.Werner and I.S.Tilinin .
Surf. Sci. 304(1994)385.

122 The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\”ori and J.Barounig.
Thin Solid Films 228(1993)56

123 Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets
I.S.Tilinin and W.S.M.Werner.
Surf. Sci. 290(1993)119.

124 Escape Probability of Auger and Photoelectrons from Solids.
W.S.M.Werner and I.S.Tilinin.
Appl. Surf. Sci. 70/71(1993)29.

125 Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\”ori and J.Barounig.
Surface and Coatings Technology 54/55(1992)329

126 Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent XPS.
W.S.M.Werner, G.C.Smith and A.K.Livesey.
Surf. Interf. Anal. 21(1992)38.

127 The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.
I.S.Tilinin and W.S.M.Werner.
Phys. Rev. B46(1992)13739

128 The Role of the Attenuation Parameter in Electron Spectroscopy
W.S.M.Werner.
J. Electr.Spectrosc. Relat. Phen. 59(1992)275.

129 Attenuation of Electrons in Non-crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Surf. Sci. Lett. 268(1992)L319.

130 A new Formalism for Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.
W.S.M.Werner and H.St\”ori.
Surf. Interf. Anal. 19(1992)83

131 Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.
W.S.M.Werner.
Surf. Interf. Anal. 18(1992)217.

132 Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.
W.S.M.Werner, W.H.Gries and H.St\”ori.
Surf. Interf. Anal.17(1991)693

133 On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.
W.S.M.Werner.
Surf. Sci. 257(1991)319

134 Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.
W.S.M.Werner.
Surf. Sci. 251/252(1991)336

135 A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies
W.S.M.Werner, W.H.Gries and H. St\”ori
J. Vac. Sci. Technol. A9(1991)21

136 Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.
W.H.Gries and W.S.M.Werner
Surf. Interf. Anal. 16(1990)149

1 Evaluation of Two Methods for Determining Shell Thicknesses of Core-shell Nanoparticles by X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, A. G. Shard, and D. G. Castner
J. Phys. Chem. C 2016, 120, 22730−22738

2 Correction to “Evaluating the Internal Structure of Core-shellNanoparticles Using X-rayy Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2016, 120, 2484 84

3 Reflection electron energy loss spectrum of single layer graphene measured on a graphite substrate
Wolfgang S.M. Werner , Alessandra Bellissimo, Roland Leber , Afshan Ashraf , Silvina Segui
Surface Science 635 (2015) L1–L3

4 Physics-based Simulation Models for EBSD: Advances and Challenges
Aimo Winkelmann, Gert Nolze, Maarten Vos, Francesc Salvat-Pujol, Wolfgang Werner
arXiv:1505.07982v1 [cond-mat.mtrl-sci] 29 May 2015

5 Evaluating the Internal Structure of Core-shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra
M. Chudzicki, W. S. M. Werner, A. G. Shard, Y.-C. Wang, D. G. Castner, and C. J. Powell
J. Phys. Chem. C 2015, 119, 17687

6 Interpretation of nanoparticle X-ray photoelectron intensities
Wolfgang S. M. Werner, Maksymillian Chudzicki, Werner Smekal, and Cedric J. Powell
Applied Physics Letters 104, 243106 (2014); doi: 10.1063/1.4884065

7 In-out asymmetry of surface excitations in reflection-electron-energy-loss spectra of polycrystalline Al
Francesc Salvat-Pujol, Wolfgang S. M. Werner, Mihaly Novak, Petr Jiricek and Josef Zemek
PHYSICAL REVIEW B 89, 205435 (2014)

8 Interlaboratory study comparing anylses of simulated angle resolved XP Spectra
Ghazalla Tasmneem, Wolfgang S.M. Werner, Werner Smekal and Cedric J. Powell
Surf. Interf. Anal 46, (2014) 321

9 Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing
D. Bianchi, L. Katona, J. Brenner, G. Vorlaufer, A. Vernes and W. S. M. Werner
Surf. Interface Anal. (2014)

10 SiON metrology using angular and energy distributions of photoelectrons
G Tasneem, C Tomastik, R Mroczynski and W S M Werner
Journal of Physics: Conference Series 439 (2013) 012005

11 Sample-morphology effects on x-ray photoelectron peak intensities. II. Estimation of detection limits for thin-film materials
Cedric J. Powell, Wolfgang S. M. Werner and Werner Smekal
050603-1 J. Vac. Sci. Technol. A 32(5), Sep/Oct 2014 http://dx.doi.org/10.1116/1.4891628

12 Sample-morphology effects on x-ray photoelectron peak intensities
Cedric J. Powell, Sven Tougaard, Wolfgang S. M. Werner and Werner Smekal
021402-1 J. Vac. Sci. Technol. A 31(2), Mar/Apr 2013 http://dx.doi.org/10.1116/1.4774214

13 Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface
Wolfgang S. M. Werner, Francesc Salvat-Pujol, Alessandra Bellissimo, Rahila Khalid, Werner Smekal ,Mihaly Novak,Alessandro Ruocco and Giovanni Stefani
PHYSICAL REVIEW B 88, 201407(R) (2013) DOI: 10.1103/PhysRevB.88.201407

14 Electron Supersurface Scattering On Polycrystalline Au
Wolfgang S. M. Werner, Mihaly Novak, Francesc Salvat-Pujol, Josef Zemek and Petr Jiricek
PRL 110, 086110 (2013) DOI: 10.1103/PhysRevLett.110.086110

15 Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm
F. Salvat-Pujol and W. S. M. Werner
Surf. Interface Anal. 2013, 45, 873–894 DOI 10.1002/sia.5175

16 Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)
Wolfgang S.M. Werner, Werner Smekal, Thomas Hisch, Julia Himmelsbach, Cedric J. Powell
Journal of Electron Spectroscopy and Related Phenomena 190 (2013) 137–143 http://dx.doi.org/10.1016/j.elspec.2013.06.007

17 In–out asymmetry and interference effects in plasmon excitation by swift charged particles traversing a surface
J. L. Gervasoni, R. O. Barrachina, S. Segui and W. Werner
Surf. Interface Anal. (2013) DOI 10.1002/sia.5331

18 Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric
O. Bethge, C. Henkel, S. Abermann, G. Pozzovivoa, M. Stoeger-Pollach, W.S.M. Werner, J. Smoliner, E. Bertagnolli
Applied Surface Science 258 (2012) 3444 doi:10.1016/j.apsusc.2011.11.094

19 Angular dependence of electron induced surface plasmon excitation
Wolfgang S.M. Werner, Werner Smekal, Francesc Salvat-Pujol, Zahra Halavani, Stephan Pfleger, Johannes Rastl, Christoph Eisenmenger-Sittner
APL 98(2011)193111

20 Oswald-Kasper-Gaukler model for reflection electron energy loss spectroscopy
F. Salvat-Pujol* and W. S. M. Werner
PHYSICAL REVIEW B 83, 195416 (2011) DOI: 10.1103/PhysRevB.83.195416

21 Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations
G. Tasneem, C. Tomastik, S. Gerhold, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. (2010)

22 Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data
G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell
Surf. Interf. Anal. 42(2010)1072

23 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
W.S.M. Werner, J. Zemek and P. Jiricek
Phys. Rev. B82(2010)155422

24 Electron transport for spectrum analysis and experiment design
W.S.M. Werner
J. Elec. Spec. Rel. Phen. 178-179(2010)154-177

25 Reflection electron energy loss spectroscopy of aluminum
P. Jiricek , I. Bartos , J. Zemek and W.S.M. Werner
Surface Science 604 (2010) 1006-1009

26 Simple algorithm for quantitative analysis of reflection electronenergy loss spectra (REELS)
W.S.M. Werner
Surface Science 604 (2010) 290-299

27 Distinguishing elastic and inelastic scattering effects in reflection electron energy loss spectroscopy
Wolfgang S. M. Werner, Josef Zemek and Petr Jiricek
PHYSICAL REVIEW B 82, 155422 2010 DOI: 10.1103/PhysRevB.82.155422

28 Electron transport for spectrum analysis and experiment design
Wolfgang S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 178 (2010) 154 doi:10.1016/j.elspec.2009.09.004

29 Simple algorithm for quantitative analysis of reflection electron energy loss spectra (REELS)
Wolfgang S.M. Werner
Surface Science 604 (2010) 290 doi:10.1016/j.susc.2009.11.019

30 Optical constants and inelastic electron-scattering data for 17 elemental metals
Wolfgang S.M. Werner, Kathrin Glantschnig and Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009,1013-1092

31 Richardson - Lucy deconvolution of reflection electron energy loss spectra
Stefan Hummel, Alexander Gross and Wolfgang S. M. Werner
Surf. Interf. Anal. (2009)

32 Report on the 47th IUVSTA Workshop “Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films”
A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. K\”over H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme
Surf.InterfaceAnal.2009,41,840 DOI 10.1002/sia.3105

33 Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals
Wolfgang S. M. Werner, Kathrin Glantschnig, Claudia Ambrosch-Draxl
J. Phys. Chem. Ref. Data, Vol. 38, No. 4, 2009 doi:10.1063/1.3243762

34 Role of surface and bulk plasmon decay in secondary electron emission
Wolfgang S. M. Werner, Alessandro Ruocco, Francesco Offi, Stefano Iacobucci, Werner Smekal, Hannspeter Winter, and Giovanni Stefani
Phys. Rev. B 78 (2008)233403

35 Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra
M.R. Went M. Vos a, W.S.M. Werner
Surf. Sci. 602(2008)2069-2077

36 Measurement and density functional calculations of optical constants of Ag and Aufrom infrared to vacuum ultraviolet wavelengths
Wolfgang S. M. Werner, Michael R. Went, Maarten Vos, Kathrin Glantschnig and Claudia Ambrosch-Draxl
Phys. Rev. B 77, R161404 (2008)

37 Analysis of reflection electron energy loss spectra (REELS)for determination of the dielectric function of solids: Fe, Co, Ni
W.S.M. Werner
Surface Science 601 (2007) 2125-2138

38 Photon and electron induced electron emission from solid surfaces
W.S.M. Werner
Cahpter 2 In “Slow Heavy Particle Induced Electron Emission from Solid Surfaces”, Springer Tracts in Modern Physics 225

39 Energy dependence of electron energy loss processesin Ge 2s photoemission
M. Novak, S. Egri, L. Kover, I. Cserny, W. Drube, W.S.M. Werner
Surf. Sci. 601(2007)2344

40 Comparison of hard and soft x-ray photoelectron spectra of silicon
F. Offi, W. S. M. Werner, M. Sacchi, P. Torelli, M. Cautero, G. Cautero, A. Fondacaro, S. Huotari, G. Monaco,G. Paolicelli, W. Smekal, G. Stefani, and G. Panaccione
Phys. Rev. B76(2007)085422

41 Surface plasmon excitation at a Au surface by 15040,000 eV electrons
Wolfgang S.M. Werner, Michael R. Went, Maarten Vos
Surf. Sci. 601(2007)L109

42 Distinguishability of N Composition Profiles In SiON FilmsOn Si By Angle-Resolved X-ray Photoelectron Spectroscopy
C. J. Powell, W. S. M. Werner, and W. Smekal
Proceedings of the NIST nanioelectonics conference 2007,CP931, Frontiers of Characterization and Metrology for Nanoelectronics,edited by D. G. Seiler, A. C. Diebold, R. McDonald, C. M. Gamer, D. Herr, R. P. Khosla, and E. M. Secula

43 Proceedings of the 11th European Conference on Applications of Surface and Interface Analysis (ECASIA 2005)25-30 September 2005, Vienna Austria
Wolfgang S.M. Werner, Christian Tomastik,Friedrich R\”udenauer and John F. Watts
Surf. Interf. Anal. Vol. 38, 1-910, ISBN 0142-2421

44 Refined calculations of effective attenuation lengths for SiO2 filmthicknesses by x-ray photoelectron spectroscopy.
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 252116 (2006)

45 Dielectric function of Cu, Ag, and Au obtained from reflection electronenergy loss spectra, optical measurements, and density functional theory.
W.S.M. Werner
APPLIED PHYSICS LETTERS 89, 213106 (2006)

46 Distinguishability of N composition profiles in SiON films on Siby angle-resolved x-ray photoelectron spectroscopy
C.J. Powell, W.S.M. Werner and W. Smekal
APPLIED PHYSICS LETTERS 89, 172101 (2006)

47 Optical constants of Cu measured with reflection electron energyloss spectroscopy (REELS).
W.S.M. Werner
Surf. Sci. 600(2006)L250-254

48 Differential surface and volume excitation probability of medium-energy electrons in solids.
W.S.M. Werner
Phys. Rev. B 74(2006) 075421

49 Angular-resolved elastic peak electron spectroscopy:experiment and Monte Carlo calculations
J. Zemek, P. Jiricek, W. S. M. Werner, B. Lesiak and A. Jablonski
Surf. Interf. Anal.38(2006)615

50 Measurement of the differential electron surface andvolume excitation probability in Cu, CuO and Cu2O
W. S. M. Werner, J. Zemek and P. Jiricek
Surf. Interf. Anal. 38(2006)628

51 Intrinsic and extrinsic excitations in deep corephotoelectron spectra of solid Ge
L. Kover, M. Novak,S. Egri,I. Cserny,Z.Berenyi,J. Toth,D. Varga,W. Drube,F. Yubero, S. Tougaard4 and W. S. M. Werner
Surf. Interf. Anal. 38(2006)569

52 EMISSION-DEPTH-SELECTIVE AUGERPHOTOELECTRON COINCIDENCE SPECTROSCOPY
W.S.M. Werner, W. Smekal, H. St\”ori, HP. Winter,G. Stefani, A. Ruocco, F. Offi,R. Gotter, A. Morgante, F. Tommasini
Elletra research highlights 2004-2005

53 Tribochemistry of mono molecular additive films on metalsurfaces, investigated by XPS and HFRR
Kolm R., Gebeshuber I.C., Kenesey E., Ecker A., Pauschitz A., Werner W.S.M.,and St\”ori H
Life Cycle Tribology 48(2005) 269-282

54 Characterization of thin films on the nanometer scale by Augerelectron spectroscopy and X-ray photoelectron spectroscopy
C.J. Powell, A. Jablonski, W.S.M. Werner, W. Smekal
Applied Surface Science 239 (2005) 470-480

55 On the energy dissipation process in incoherent electron scattering
Wolfgang S.M. Werner, Peter Schattschneider
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 65-80

56 Oxidation of beryllium: a scanningAuger investigation
C. Tomastik,W. Werner and H. St\”ori
Nucl. Fusion 45 (2005) 1061-1065

57 Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy
Wolfgang S. M. Werner, Werner Smekal, Herbert Stoeri,Hannspeter Winter ,Giovanni Stefani, Alessandro Ruocco, and Francesco Offi, Roberto Gotter Alberto Morgante and Fernando Tommasini
Phys. Rev. Lett. 94 (2005) 038302

58 A new NIST Database for te Simulation of Electron spectra for Surface Analysis (SESSA): Application to angle resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on Silicon
C.J. Powell, W. Smekal and W.S.M. Werner
Characterization and Metrology for ULSI Technology 2005, Richardson, Texas, 15-18 March 2005

59 Angular-resolved photoelectron spectroscopyof corrugated surfaces
K. Olejnik, J. Zemek and W.S.M. Werner
Surface Science 595 (2005) 212-222

60 Coherence in electron energy loss spectrometry
P. Schattschneider and W.S.M. Werner
Journal of Electron Spectroscopy and Related Phenomena 143 (2005) 81-95

61 Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitativeAuger-electron spectroscopy and X-ray photoelectronspectroscopy
Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell
Surf. Interface Anal. 2005; 37: 1059-1067

62 Trajectory reversal approach for electron backscattering from solid surfaces
W.S.M. Werner
PHYSICAL REVIEW B 71, 115415 (2005)

63 Simulation of electron spectra for surface analysisusing the partial-intensity approach (PIA)
W.S.M. Werner
Surf. Interface Anal. 2005; 37: 846-860

64 Measurement of the surface excitation probabilityof medium energy electrons reflected fromSi, Ni, Ge and Ag surfaces
Wolfgang S.M. Werner, Laszlo Kover, Sandor Egri,Jozsef Toth, Deszo Varga
Surface Science 585 (2005) 85-94

65 Differential probability for surface and volumeelectronic excitations in Fe, Pd and Pt
W.S.M. Werner
Surface Science 588 (2005) 26-40

66 Investigation of Ta grain boundary diffusion in copper by means ofAuger electron spectroscopy
G.Er delyi, G.Langer, J.Nyeki, L.Kover, C.Tomastik, W.S.M. Werner, A.Csik, H.St\”ori D.L. Beke
Thin Solid Films 459 (2004) 303-307

67 Quantitative surface analysis with electrons
W.S.M. Werner
Applied Surface Science 235 (2004) 2-14

68 Surface sensitivity in electron spectroscopy:coherent versus incoherent scattering models
W. Smekal, W.S.M. Werner, C.S. Fadley and M.A. van Hove
Journal of Electron Spectroscopy and Related Phenomena 137∆C140 (2004) 183∆C187

69 Electron Transport in Solids Chapter 10 in the book “Surface Analysis by Auger and X-Ray PhotoelectronSpectroscopy”
W.S.M. Werner
edited by Dave Briggs and John Grant, IMPublications, Chichester/UK,ISBN 1-901019-047 (2003) 235 - 259

70 Charakterisierung monomolekuarer Schmierstofffilme
R. Kolm, I. Gebeshuber, C. Jogl, R. Kleiner, W. Werner und H. St\”ori
in “Zuverl‰ssige Tribosysteme”, Symp. 2003 der ˆsterr. tribologischen Gesellschaft,ISBN 3-901657-13-4

71 Scattering angle dependence of the surface excitation probability in reflection electron enery loss spectra.
W.S.M. Werner, C Eisenmenger–Sittner, J. Zemek and P. Jiricek
Phys. Rev. B. 67(2003)

72 Obtaining quantitative information on surface excitations from reflection electron energy loss spectra (REELS)
W.S.M. Werner
Surf. Interf. Anal. 35(2003)347

73 Surface and bulk plasmon coupling observed in refelection electron energy loss spectra
W.S.M. Werner
Surf. Sci. 526(2003)L159-L164

74 Wannier-Stark States in Finite Superlattices
M. Kast, C. Pacher, G. Strasser, E. Gornikand W.S.M. Werner
Phys. Rev. Lett. 89(2002)136803

75 Comparison of source functions obtained by using QUASES and the partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni
L. Kñver, S. Tougaard, W.S.M. Werner, and I. Cserny
Surf. Interf. Anal. 33(2002)681

76 Quantitative model for the surface sensitivity in Auger-photoelectron coincidence spectroscopy (APECS)
W.S.M. Werner, H. St\”ori and HP. Winter
Surf. Sci. 518(2002)L569

77 Line Shape Analysis of High Energy X-ray Induced Auger and Photoelectron Spectra of Thin Cu and Ni Films
W.S.M. Werner, L. Kñver, J. Toth and D. Varga
J. Electron, Spectrosc. Rel. Phen. 122(2002)103

78 Angular dependence of the surface excitation probability for mediumenergy electrons backscattered from Al and Si surfaces
Wolfgang S. M. Werner,Werner Smekal, Herbert Stoeriand Christopher Eisenmenger-Sittner
J. Vac. Sci. Technol. A 19, Sep-Oct 2001

79 Angular Dependence of the Surface Excitation Probability for Medium Energy Electrons Backscattered from Al and Si Surfaces.
W.S.M. Werner, W. Smekal, C. Eisenmenger-Sittner and H. St\”ori
J. Vac. Sci. Technol. A19(2001)2388

80 The Three-step Model in Electron Spectroscopy Revisited: 1. Angular Distribution of Auger Electron Emission from Non-crystalline Al. Si and Cu Substrates.
W.S.M.Werner, H. Tratnik, J. Brenner and H. St\”ori
Surf. Sci. 495(2001)107

81 Angular Distribution of Surface Excitations for Electrons Backscattered from Al and Si Surfaces
W.S.M. Werner, W. Smekal, T. Cabela, C. Eisenmenger-Sittner and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 114(2001)363

82 Surface Excitation Probability of Medium .Energy Electrons in Metals and Semiconductors.
W.S.M.Werner, W. Smekal, C. Tomastik and H. St\”ori
Surf. Sci. 486(2001)L461

83 Electron Transport in Solids for Quantitative Surface Analysis: a Tutorial Review
W.S.M.Werner
Surf. Interf. Analysis 31(2001)141

84 Angular Distribution of the Surface Excitation Probability for Medium .Energy Electrons Backscattered from a Polycrystalline Au Surface
W.S.M.Werner, W. Smekal and H. St\”ori
Surf. Interf. Analysis 31(2001)475

85 Elastic Electron Reflection for Determination of the Inelastic Mean Free Path of Medium Energy Electrons in 24 Elemental Solids for Energies between 50 and 3400~eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
J. Electron, Spectrosc. Rel. Phen. 113(2001)127

86 Electron Probe Microanalysis Inverse Modelling
H.W. Wagner, W.S.M.Werner, H. St\”ori and L. Richardson
Nucl. Instr. Methods. Phys. Res. B184(2001)450

87 On Line Shape Analysis in X-ray Photoelectron spectroscopy
W.S.M.Werner, T. Cabela, J. Zemek and P. Jiricek
Surf. Sci. 470(2001)325

88 Electron Inelastic Mean Free Path measured by Elastic Peak Electron Spectroscopy for 24 Solids between 50 and 3400 eV.
W.S.M.Werner, C. Tomastik, T. Cabela, G. Richter and H. St\”ori
Surf. Sci. 470(2000)L123

89 Electron Scattering Correction of X-ray-excited Ni and Cu KLL Auger Spectra emitted from thin and thick metallic samples
K. Cserny, W.S.M. Werner, H. Stñri and L. Kñver
Surf. Interf. Analysis 29(2000)126

90 Comparison of Three Universal Curves for the Escape Probability of X-ray excited Electrons II. Evaluation of Layer Thicknesses as Determined by Total Electron Yield (TEY)
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)386

91 Comparison of Three Universal Curves for the Escape Probability ofX-ray excited Electrons I.-Theory
H. Ebel, R. Svagera, M.F. Ebel and W.S.M. Werner
Adv. X-ray Anal. 44(2000)380

92 Escape Probability of Electrons in Total Electron Yield Experiments .
H. Ebel, R. Svagera, W.S.M. Werner and M.F. Ebel
Adv. X-ray Anal. 41(1999)367

93 Modelling Kinetic Electron Emission for the Impact of slow N$^+$ on LiF.
S. Zamini, G. Betz, W.S.M. Werner, F. Aumayr, HP. Winter, J. Anton and B. Fricke
Surf. Sci. 417(1998)372

94 Calculation of Ionization Depth Distributions and Backscattering Coefficients Applying a New Simulation Approach
H. W. Wagner and W. S. M. Werner
X-RAY SPECTROMETRY,27(1998)373

95 Selfconsistent Calibration of Ti$_x$C$_{1_x}$ Auger spectra.
P.M.J.Schm\”olz, W.S.M.Werner, H. Wagner, H.St\”ori and J. Kiefer.
Surf. Interf. Anal, 26(1998)590

96 Elimination of the Inelastic Tail and Suppression of the Background of Backreflected Primary and Secondary Electrons in AES/XPS.
W.S.M.Werner
Surf. Interf. Anal, 26(1998)455

97 A New Method for the Calculation of Ionization Depth Distribution in EPMA
H. Wagner and W.S.M.Werner
X-Ray Spectrometry, 27(1998)373

98 Auger Voltage Contrast (AVC) for Twodimensional Junction Delineation.
W.S.M.Werner, H. Lakatha, H. Smith, L. LeTarte, V. Ambrose and J. Baker
J. Vac. Sci. and Technol., B16(1998)420

99 Nondestructive Depth Profiling in AES by Means of Partial Intensity Analysis.
W.S.M.Werner.
J.Vac. Sci. Technol, A15(1997)465

100 Compositional Distribution in the first Monolayers from Evaluation of AES/XPS Spectra.
W.S.M.Werner
Jap. J. of Surface Anal., 3(1997)312

101 Slowing Down of Medium Energy Electrons in Solids.
W.S.M.Werner
Phys. Rev., B55(1997)14925

102 Escape Probability of Electrons in Total Electron Yield Experiments
H.Ebel, R.Svagera,W.S.M.Werner and M.F. Ebel
Adv. x-Ray Analysis, in print

103 Quantitative Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
I.S. Tilinin, A. Jablonski and W.S.M. Werner
Progress in Surface Science 52(1996)193-335

104 A Contribution to quantitative X-Ray Analysis by Total Electron Yield Measurement (TEY):1. Sampling Depth of the Method.
H.Ebel, R.Svagera, M.F.Ebel, N.Zagler, W.S.M.Werner, H.St\”ori and M. Gr\”oschl
Proceedings of the VI th european conference on applicationsof surface and interface analysis, ECASIA, Montreux,1996, pp991.

105 Quantitative Surface Analysis by Means of AES.
I.S.Tilinin, A.Jablonski and W.S.M.Werner.
Prog. Surf. Sci., 52(1996)193

106 Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.
H.Wagner, A.Pfeiffer, C.Schiebl and W.S.M.Werner.
Mikrochim. Act., 13(1996)533

107 Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units.
H.Wagner, C.Schiebl and W.S.M.Werner.
Mikrochim. Act.,13(1996)623

108 Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.
W.S.M.Werner.
Mikrochim. Act., 13(1996)13

109 Sputtered Decorative Hard Coatings within the System LaB6-ZrB12.
C.Mitterer, H.M.Ott, J. Komenda-Stallmaier, P.Losbichler, P.Schm\”olz, W.S.M.Werner and H.St\”ori.
Vacuum 46(1995)1281

110 Partial Intensity Analysis (PIA) for Quantitative Electron Spectroscopy.
W.S.M.Werner
Surf. Interf. Anal., 23(1995)737

111 Efficient Calculation of Photoelectron Angular Distribution.
W.S.M.Werner, I.S.Tilinin and A.Jablonski.
Surf. Interf. Anal., 23(1995)823

112 Magic Angle for Surface Roughness in XPS/AES Intensity Ratios.
W.S.M.Werner.
Surf. Interf. Anal., 23(1995)696.

113 Influence of Multiple Elastic and Inelastic Scattering on Photoelectron Lineshape
W.S.M.Werner.
Phys. Rev. B52(1995)2964.

114 Inelastic Mean Free Path of Medium Energy Electrons in Au, Pt, Ni and AlDetermined by Elastic Peak Electron Spectroscopy.
H.Beilschmidt, I.S.Tilinin and W.S.M.Werner.
Surf. Interf. Anal. 22(1994)120

115 Influence of the Elastic Scattering Cross Section on Angle Resolved Reflection Electron Energy Loss Spectra of Polycrystalline Al, Ni, Pt and Au.
W.S.M.Werner and M.Hayek.
Surf. Interf. Anal. 22(1994)79

116 Comparison of Angle-Resolved XPS/AES with Depth Profile Restoration from Inelastic Background Analysis..
W.S.M.Werner, and I.S.Tilinin.
J. Vac. Sci. Technol. A12(1994)2337.

117 Simultaneous Background Subtraction and Depth Profile Determination from AES/XPS Measurements.
W.S.M.Werner, I.S.Tilinin, H.Beilschmid and M.Hayek.
Surf. Interf. Anal. 21(1994)21

118 Angular Distribution of Electrons Reflected Elastically from Noncrystalline Solid Surfaces.
W.S.M.Werner, M.Hayek and I.S.Tilinin.
Phys. Rev. B50(1994)4819.

119 Transport of Medium Energy Electrons in Solids: Application to Electron Spectroscopy of Non-Crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Prog. Surf. Sci. 46(1994)46.

120 New Developments in Theory of Fast Electron Scattering in Solids: Application to Microbeam Analysis
I.S.Tilinin and W.S.M.Werner.
Mikrochim. Act. 114/115(1994)485.

121 Reply to Comment on “Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets” by V.M. Dwyer
W.S.M.Werner and I.S.Tilinin .
Surf. Sci. 304(1994)385.

122 The Influence of Various Sputter Gases on the Magnetron Sputtering of ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H. St\”ori and J.Barounig.
Thin Solid Films 228(1993)56

123 Angular and Energy Distribution of Auger Electrons Emitted from non-crystalline Targets
I.S.Tilinin and W.S.M.Werner.
Surf. Sci. 290(1993)119.

124 Escape Probability of Auger and Photoelectrons from Solids.
W.S.M.Werner and I.S.Tilinin.
Appl. Surf. Sci. 70/71(1993)29.

125 Sputter Deposition of Decorative Hard Coatings Based on ZrB2 and ZrB12
P. Losbichler, C. Mitterer, W.S.M.Werner, H.St\”ori and J.Barounig.
Surface and Coatings Technology 54/55(1992)329

126 Maximum Entropy Analysis of the Effects of Elastic Scattering on Angle Dependent XPS.
W.S.M.Werner, G.C.Smith and A.K.Livesey.
Surf. Interf. Anal. 21(1992)38.

127 The Escape Probability of Auger Electrons from non-crystalline Solids: exact Solution in the Transport Approximation.
I.S.Tilinin and W.S.M.Werner.
Phys. Rev. B46(1992)13739

128 The Role of the Attenuation Parameter in Electron Spectroscopy
W.S.M.Werner.
J. Electr.Spectrosc. Relat. Phen. 59(1992)275.

129 Attenuation of Electrons in Non-crystalline Solids.
W.S.M.Werner and I.S.Tilinin.
Surf. Sci. Lett. 268(1992)L319.

130 A new Formalism for Angle Resolved AES and XPS taking Elastic Electron Scattering into Account.
W.S.M.Werner and H.St\”ori.
Surf. Interf. Anal. 19(1992)83

131 Towards a universal Curve for Electron Attenuation: Elastic Scattering Data for 45 Elements.
W.S.M.Werner.
Surf. Interf. Anal. 18(1992)217.

132 Analytical Expression describing the Attenuation of Auger and Photoelectrons in Solids.
W.S.M.Werner, W.H.Gries and H.St\”ori.
Surf. Interf. Anal.17(1991)693

133 On the Attenuation of Auger and Photoelectrons in Solids with thin Overlayers.
W.S.M.Werner.
Surf. Sci. 257(1991)319

134 Attenuation of Signal Electrons in Solids: the Influence of Anisotropy of Photoelectron Emission.
W.S.M.Werner.
Surf. Sci. 251/252(1991)336

135 A Monte Carlo Study of the Angular Dependence of the Depth Distribution Function of Signal Electrons in Electron Spectroscopies
W.S.M.Werner, W.H.Gries and H. St\”ori
J. Vac. Sci. Technol. A9(1991)21

136 Take-Off Angle and Film Thickness Dependences of the Attenuation Length of X-ray Photoelectrons by a Trajectory Reversal Method.
W.H.Gries and W.S.M.Werner
Surf. Interf. Anal. 16(1990)149